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Ion beam analysis
Results: 44

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31	F R A U N H O F E R I N S T I T U T E F O R M E C H A N I C S O F M AT E R I A L S I W M COMPONENTS IN MICROELECTRONICS AND MICROSYSTEMS TECHNOLOGY Your competent partner for Add to Reading List Source URL: www.en.iwm.fraunhofer.de Language: English - Date: 2011-11-18 03:55:18 Technology Electron microscopy Failure Thin film deposition Microtechnology Microelectromechanical systems Failure analysis Wafer bonding Focused ion beam Science Semiconductor device fabrication Scientific method
32	Simulation and Analysis of Image Data from Crossed Beam Experiments George C. McBane Department of Chemistry, The Ohio State University, Columbus, OH[removed]Simulation of images expected from velocity mapping of crossed Add to Reading List Source URL: faculty.gvsu.edu Language: English - Date: 2013-11-26 13:46:30 Physics Spectroscopy Mass spectrometry Crossed molecular beam Time of flight Ring-imaging Cherenkov detector Wavelength Photofragment-ion imaging Chemistry Science Physical chemistry
33 $Scanning electron microscope / Electron microscope / Focused ion beam / Electron backscatter diffraction / Failure analysis / Nanometrology / Microscope / Characterization / Phenom / Scientific method / Science / Electron microscopy$	Who Are We? The Nondestructive Analysis (NOVA) Center located at Western Kentucky University is the only facility of its kind at a North American University, home to one of the world’s largest Large Chamber Scanning E Add to Reading List Source URL: www.largechamber.com Language: English - Date: 2012-03-05 10:13:47 Scanning electron microscope Electron microscope Focused ion beam Electron backscatter diffraction Failure analysis Nanometrology Microscope Characterization Phenom Scientific method Science Electron microscopy
34	Zyvex sProber™ The Installable and Removable Solution for the Semiconductor Industry Patents Pending Features and Benefits Add to Reading List Source URL: www.zyvex.com Language: English - Date: 2012-07-29 09:31:19 Zyvex Scanning electron microscope Electron microscope Failure analysis Electron microscopy Science Focused ion beam
35	Zyvex dProber™ The Door-Mountable Solution for the Semiconductor Industry Features and Benefits The Zyvex dProber™, part of the NanoWorks® Tools product line, is a dedicated system that is optimized to electrically Add to Reading List Source URL: www.zyvex.com Language: English - Date: 2012-07-29 09:30:07 Focused ion beam Zyvex Electron microscope Failure analysis Electron microscopy Science Scanning electron microscope
36	Cultural Heritage Advanced Research Infrastructures: Synergy for a Multidisciplinary Approach to Conservation/Restoration Population of Partner description Add to Reading List Source URL: iba.atomki.hu Language: English - Date: 2010-07-23 05:08:55 Spectroscopy Particle-induced X-ray emission Surface chemistry Nuclear microscopy Microprobe Ion beam ATOMKI Microbeam Ion beam analysis Physics Science Scientific method
37	SysNova: Contactless Asteroid Modification System MOSAIC: Modification of the Orbit of a Small Asteroid with Ionic Collisions Challenge Analysis Executive Summary Add to Reading List Source URL: esamultimedia.esa.int Language: English - Date: 2014-04-09 07:20:54 Aerospace engineering Ion Beam Shepherd Spacecraft propulsion Plasma physics Thin film deposition Medicine Ion thruster Ion beam Irritable bowel syndrome Ions Health Physics
38	PDF Document Add to Reading List Source URL: www.kestcells.eu Language: English - Date: 2014-05-07 15:11:42 Ions Surface chemistry Nuclear physics Ion beam analysis Particle accelerators Particle-induced X-ray emission Ion beam Nvidia Ion Physics Science Materials science
39	Handbook on Best Practice for Minimising Beam Induced Damage during IBA Editors D. Benzeggouta, I. Vickridge Add to Reading List Source URL: spirit-ion.eu Language: English - Date: 2012-11-29 08:33:40 Science Condensed matter physics Nuclear physics Rutherford backscattering spectrometry Collision cascade Sputtering Stopping power Ion beam analysis Low-energy ion scattering Physics Materials science Chemistry
40	IBA ION BEAM ANALYSIS ANALYSE PAR Add to Reading List Source URL: www.ipnas.ulg.ac.be Language: French - Date: 2005-06-06 12:03:21

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